Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)
Carl Zeiss Axio Observer Z1RP Inverted Microscope

Carl Zeiss Axio Observer Z1RP Inverted Microscope

The Inverted Confocal LSM 710 has the following features:

Institution: 
University of KwaZulu-Natal
Microscope
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope

The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris

Institution: 
Nelson Mandela Metropolitan University
Microscope
Field Emission Scanning Electron Microscope (FE-SEM)  with cathodoluminescene spectrometer JSM-7800F  Electron microscope

Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope

This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana

Institution: 
University of the Free State
Microscope