Equipment Filter

Bruker Dimension Icon Scanning Probe Microscope (SPM) Scanning Probe Microscopes

Bruker Dimension Icon Scanning Probe Microscope (SPM) Scanning Probe Microscopes

The Dimension Icon SPM has modules that can map low-and mid-strength electrical currents, resistance and capacitance, with nano-scale resolution, o

Institution: 
University of Pretoria
MicroscopeScanning Probe Microscopes
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

JEOL ARM200F double aberration corrected

Institution: 
Nelson Mandela Metropolitan University
Microscope
Philips CM20 Transmission Electron Microscope (TEM)

Philips CM20 Transmission Electron Microscope (TEM)

The Philips CM20 is an analytical TEM, with a tungsten electron gun, which can be operated between 20 and 200kV.

Institution: 
Nelson Mandela Metropolitan University
Microscope
Philips EM 420 Transmission Electron Microscope (TEM)

Philips EM 420 Transmission Electron Microscope (TEM)

The Philips EM420 is a standard TEM with a lattice resolution of 0.3nm, and operates at a maximun accelerating voltage of 120 kV.

Institution: 
Nelson Mandela Metropolitan University
Microscope