Equipment Filter
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
JEOL ARM200F double aberration corrected
Institution:
Nelson Mandela Metropolitan University
Microscope
Philips CM20 Transmission Electron Microscope (TEM)
The Philips CM20 is an analytical TEM, with a tungsten electron gun, which can be operated between 20 and 200kV.
Institution:
Nelson Mandela Metropolitan University
Microscope
Philips EM 420 Transmission Electron Microscope (TEM)
The Philips EM420 is a standard TEM with a lattice resolution of 0.3nm, and operates at a maximun accelerating voltage of 120 kV.
Institution:
Nelson Mandela Metropolitan University
Microscope
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Institution:
Nelson Mandela Metropolitan University
Microscope
Widefield High-content Analysis System ImageXpress Micro XLS
Institution:
Nelson Mandela Metropolitan University
Microscope