Equipment Filter
Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)
Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:
Institution:
University of the Witwatersrand
Diffractometers›X-ray Diffractometer (XRD)
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.
Institution:
University of the Witwatersrand
Microscope›Atomic Force Microscope (AFM)
Maccor 4300 Electrochemical Test System
The Maccor Battery Test System Model 4300 for electrochemical cycling (testing) of battery cells has 8 channels each with 4 different current range
Institution:
University of the Witwatersrand
Other
Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)
An XRD facility optimised for the following measurements
Institution:
University of the Witwatersrand
Diffractometers›X-ray Diffractometer (XRD)
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes
The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ
Institution:
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)