Equipment Filter
Zeiss Axioskop Mot Plus Epifluorescent Microscope Optical Microscope
The Axioskop Mot Plus microscope combines a variety of excelent optical and technologically features.
Institution:
Mintek
Microscope
FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)
The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analy
Institution:
Mintek
Microscope
Zeiss LEO 440 QEMSCAN SEM
The LEO 440 scanning electron microscope platform is equipped with four light element energy
Institution:
Mintek
Microscope
Jeol 840A Scanning Electron Microscope (SEM)
The JEOL 840A is a medium resol
Institution:
Mintek
Microscope
Carl Zeiss SMT Ltd. EVO MA 15 Scanning Electron Microscope (SEM)
The EVO MA 15 is the analytical SEM
Institution:
Mintek
Microscope
Olympus Industrial Olympus-SZX16 Stereo Microscope
The SZX16 is designed for advanced research and has a maximum numerical aperture of 0
Institution:
Mintek
Microscope
Joel 2100F Transmission Electron Microscope (TEM)
The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultra-h
Institution:
Mintek
Microscope