Equipment Filter
Bruker IFS 66 V/S FTIR (Fourier Transform Infrared Instrument Technology) Fourier Transform Infrared Spectrometer (FTIR)
This is a Bruker Optics IFS 66 V/S FTIR Spectrometer which is a state-of-the-art Fourier Transform infrared instrument that can achieve up to 100 s
Agilent Technologies and Polymer Laboratories 1200 HPLC/GPC-SEC Analysis System with Polymer Laboratories ELS-2100 Ice Detector Liquid Chromatograph (LC)
The Agilent Technologies 2-D HPLC system is used for liquid chromatography at the critical point of adsorption and includes an HPLC system hardware
Princeton Applies Science and Uniscan 370 Princeton Applied Research Scanning Electrochemical Microscopy (SCEM) workstation Model TSTRM-12 Uniscan 12-Channel Robotic Electrochemical Sensor Testing Station Electron Microscopes
The Multi-Channel Scanning Electrochemical Workstation is a hyphenated instrumentation that consists of a Model 370 Princeton Applied Research (PAR
Mettler Toledo RC1su MP10 HC RTCaITM Reactor Package with RCIr45m and accessories
The Mettler Toledo RC1su MP10 HC RTCalTM is a medium pressure RC1 reactor with real time calorimetric capabilities (the RTCalTM capability) to me
Mettler Toledo Thermal Analysis System consisting of STARe Software TGA/STDTA1600 oC DSC 822e/400 modular unit, DSC 827e High Pressure modular unit
The METLER-Toledo Thermal Analysis System allows for simultaneous thermographic and differential thermal analyses as well as differential scanning
Physical Electronics PHI 5000 XPS/ESCA -X-ray Photoelectron Spectroscope/Electron Spectroscopy for Chemical Analysis (ESCA) X-ray Photoelectron Spectroscope
The XPS/ESCA system is a multi-technIque surface analysis instrument based on highly successful scanning x-ray microprobe technology.
Zeiss Basic SPM System; AFM and STM with a Vibration Isolation Chamber, Potentiostat/Galvanostat
In the 1980's Binning & Rohrer, developed a technique from studying surface structures termed Scanning Tunneling Microscopy (STM).
Zeiss Atomic Force Microscopy with electrochemical capabilities Electron microscope
An atomic force microscope is optimised for measuring surface features that are extremely small in the nanometer scale.