Equipment Filter
FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)
The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analy
Institution:
Mintek
Microscope
Jeol 840A Scanning Electron Microscope (SEM)
The JEOL 840A is a medium resol
Institution:
Mintek
Microscope