Equipment Filter
ABB Bomen DAS Fourier Transform Infrared Spectroscopy (FTIR) Fourier Transform Infrared Spectrometer (FTIR)
The ABB Bomem MB3000
Horiba Jobin Yvon Nanolog (JYN) Spectro-fluorometer
It is a spectro-fluorimeter designed to measure photoluminescence of li
Spectra Physics Tsunami Laser
The Tsunami mode-locked Ti:Sapphire laser provides the widest pulse width range, the broadest wavelength coverage and the highest power levels of a
Cryogenic 5 Tesla Cryogen Free Mini-VSM with Integrated VTI and high temperature facility to 700 K
The Mini Cryogen Free Measurement system (CFM) is a Physical Property Measurement System (PPMS) with several measurement options on the same system
Oxford Microbeams OM2000 Ion microbeam endstage with triplet quadrupole lens assembly (OM150) and auxiliary equipment
The microprobe is used primarily for experiments where the spatial inhomogeneity is inherent in specimens of real interest.
UNISA AFM-MFM Multimode System Atomic Force Microscope (AFM)
Atomic Force Microscopy (AFM) with multimode facility like magnetic force microscopy can be used for surface analysis, including magnetic imaging.
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
JEOL ARM200F double aberration corrected
Carl Zeiss 733 Microprobe
The JEOL-733 electron microprobe is an SEM, which is optimized for high accuracy in quantitative analysis by EDS and by wavelength dispersive spect
Jeol 733 Super-probe
The JEOL 733 Superprobe combines four wavelength dispersive spectrometers (WDS) and one energy dispersive spectrometer (EDS) with scanning electron
Bruker 80 V FTIR and Raman with Closed Cycle Helium Cryostat Fourier Transform Infrared Spectrometer (FTIR)
The Bruker 80 V FTIR/Raman sy