Equipment Filter
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Institution:
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Institution:
Nelson Mandela Metropolitan University
Microscope
Roche 454-GS Junior DNA sequencing platform
The 454-GS Junior DNA Sequencing Platform is focussed on small scale high-throughput DNA sequencing as opposed to the high volume sequencing capaci
Institution:
Rhodes University
Other