Equipment Filter
Bruker Atomic Force Microscope Atomic Force Microscope (AFM)
Atomic force microscopy utilizes the combination of an advanced scanning probe microscope, sophisticated software, and a specific mode or tec
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope›Atomic Force Microscope (AFM)
Carl Zeiss Auriga Cobra FIB Focused Ion Beam Scanning Electron Microscope (FIBSEM)
The Auriga Cobra FIB FESEM i
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope
Agilent Technologies (USA) Multimode Scanning Probe Microscopy with Electrochemical Capabilites (MMSPM-EC) Scanning Probe Microscopes
This is the so-called MultiMode Scanning Probe Microscope.
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope›Scanning Probe Microscopes
Carl Zeiss THMS 600 Polarised Optical Microscope
The Carl Zeiss Axiovisson
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope
Jeol JSM 7500F Scanning Electron Microscope
The JSM-7500F is an analytical Field Emission
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope
Omicron Nano-Technologies VT-STM Scanning Probe Microscopes (AFM/STM) Scanning Probe Microscopes
This is a UHV STM with the option for thin film deposition.
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope›Scanning Probe Microscopes
Omicron Nano-Technologies VT UHV SPM Scanning Tunelling Microscope
The Variable Temperature Scanning Tunneling Microscope system combines the power of scanning tunneling microscopy (
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope
Jeol JEM 2100 Transmission Electron Microscope Electron Microscopes
The JEM-2100 Electron Microscope provides solutions for a wide range of problems in the fields of nanoelectronics, materials, and biological scienc
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)