Omicron Nano-Technologies VT UHV SPM Scanning Tunelling Microscope

Model: 
VT UHV SPM Scanning Tunelling Microscope
Supplier: 

The Variable Temperature Scanning Tunneling Microscope system combines the power of scanning tunneling microscopy (STM) which allows observations at nanometer scale of conducting and semiconducting surfaces with the capability to control sample temperatures from 25 K to 1500 K in an ultrahigh vacuum (UHV) environment. The systems internal spring suspension mechanism with eddy current damping ensures excellent vibration isolation, thus high-resolution SPM. The bolt-on chamber houses a sample carousel for up to 6 samples/tips.

Category: 
Microscope
Location
Department: 
National Centre for Nano-Structured Materials
Building: 
Building 19B Scientia Campus
Meiring Naude Road
Brummeria
Pretoria
0184

Contact Person/s

Name: Margaret Ward
Phone: +27 12-841-3706
Email: mward@csir.co.za