Omicron Nano-Technologies

Omicron Nano-Technologies VT UHV SPM Scanning Tunelling Microscope

The Variable Temperature Scanning Tunneling Microscope system combines the power of scanning tunneling microscopy (STM) which allows observations at nanometer scale of conducting and semiconducting surfaces with the capability to control sample temperatures from 25 K to 1500 K in an ultrahigh vacuum (UHV) environment.

Contact Person/s

Name: Margaret Ward
Phone: +27 12-841-3706
Email: mward@csir.co.za
Omicron Nano-Technologies VT UHV SPM Scanning Tunelling Microscope

Omicron Nano-Technologies VT-STM Scanning Probe Microscopes (AFM/STM) Scanning Probe Microscopes

This is a UHV STM with the option for thin film deposition. The equipment is utilised for surface characterisation and growth of nanolayer materials for nanoscience research. The components include:

Contact Person/s

Name: Dr KT Hillie
Phone: +27 12-841-3874
Email: THillie@csir.co.za

Grantholder

Title: Dr
First Name: KT
Last Name: Hillie
Phone: +27 12-841-3874
Email: THillie@csir.co.za
Omicron Nano-Technologies VT-STM Scanning Probe Microscopes (AFM/STM) Scanning Probe Microscopes