Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)
An XRD facility optimised for the following measurements
Jobin Yvon Heriba TX64000 Raman Spectrometer and Bruker Vertex 70 FTIR Spectrometer Raman Spectrometer
The TX64000 Raman Spectrometer and Bruker Vertex 70 FTIR Spectrometer is a triple grating spectrometer system with ultra high spectral resolution,
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope
This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana
Bruker High Perfomance Digital FT-NMR 400 Avance III HD NanoBay Spectrometer & 500 Avance III HD NMR Spectrometer
The spectrometers use nuclear magnetic resonance to provide information on the molecular and structural dynamics of biological, organic and inorgan
Multifunctional Optical platform Ocean Optics based system
The equipment consists of the following sub-units:
- Ellipsometry unit,
- Normal incidence optical rectometry unit,