Equipment Filter
Philips CM200 Transmission Electron Microscope (TEM) Electron Microscopes
The Philips CM200 transmission electron microscope (TEM) operating at up to 200 kV is a very versatile microscope.
FEI Quanta 400 SEM Electron Microscopes
The FEI Quanta 400 FEG is the most versatile high resolution low-vacuum FEG SEM with extended low-vacuum capabilities for the really challenging sa
FEI Nova 600 Nanolab Electron Microscopes
The Nova 600 NanoLab brings new capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex stru
FEI Tecnai G2 Spirit Transmission Electron Microscope (TEM) Electron Microscopes
The FEI Tecnai transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, ma
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Jeol JSM-840 SEM Electron Microscopes
The JEOL JSM-840 is a multi-purpose SEM capable of acceleration voltages up to 40kV.
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes
The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ
Electron nano-beam lithography JEBL-7001F Electron Microscopes
JEBL-7001F Electron Nano-beam Lithography with Four Nano Probe Electron Device Testing Station and Cantilever Probe Scanner at low Temperatures is