Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

Model: 
JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer
Manufacturer: 
Jeol
Supplier: 
Advanced Laboratory Solutions
Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.

The low vacuum mode, which can be accessed by the click of a mouse, allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto stigmator, auto gun (saturation, bias and alignment), and automatic contrast and brightness.

Condition: 
New
Category: 
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)
Disciplines: 
Botany, Entomology
Life Expectancy: 
20years
Location
Department: 
Botany
Building: 
Ground Floor, Plant Sciences Building
University of Fort Hare
1 King Williams Town Road
East London
5700

Contact Person/s

Name: Prof AJ Afolayan
Phone: +27 40-602-2323
Email: aafolayan@ufh.ac.za
Estimated Cost and Availability
Internal: 
R100
Per Sample
External: 
R150
Per Sample
Private Sector: 
R300
Per Sample

Grantholder

Title: Prof
First Name: AJ
Last Name: Afolayan
Phone: +27 40-602-2323
Email: aafolayan@ufh.ac.za
Funding Information
Equipment Price: 
R1,919,386
Year of Acquisition: 
2007