Equipment Filter

Carl Zeiss Superresolution ELYRA S1 with SR-SIM and LSM 780 technology

Carl Zeiss Superresolution ELYRA S1 with SR-SIM and LSM 780 technology

The Supperresolution ELYRA S1 utilizes SR-SIM (Super resolution Structured Illumination Microscopy) technology to yield resolution of up to double

Institution: 
Stellenbosch University
Microscope

Jeol JEM 1200EXII Electron Microscopes

A JEOL JEM 1200 EXII allows users to perform conventional TEM with thin-sectioned specimens, X-ray microanalysis, and other transmission electron m

Institution: 
Stellenbosch University
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)