Equipment Filter

Bruker Optics Germany Fourier Transform Infrared Spectroscopy (FTIR) Spectrophotometer; Powder X-ray diffractometer (XPRD); Thermo Gravimetric Analyser(TGA)/Differential Scanning Calorimeter (DSC) UV/Vis Spectrophotometer Fourier Transform Infrared Spectr

Bruker Optics Germany Fourier Transform Infrared Spectroscopy (FTIR) Spectrophotometer; Powder X-ray diffractometer (XPRD); Thermo Gravimetric Analyser(TGA)/Differential Scanning Calorimeter (DSC) UV/Vis Spectrophotometer Fourier Transform Infrared Spectr

This suite of instruments, collectively possess the following features:

Institution: 
University of Zululand
SpectrometersFourier Transform Infrared Spectrometer (FTIR)
Agilent Technologies Agilent 6850 GC, Agilent 5975 C GC/MS System Gas Chromatograph (GC)

Agilent Technologies Agilent 6850 GC, Agilent 5975 C GC/MS System Gas Chromatograph (GC)

The Agilent 6850 GC, combined with the 5975C VL GC/MSD, has a single inlet and detector.

Institution: 
University of Zululand
ChromatographsGas Chromatograph (GC)Gas Chromatograph coupled to Mass Spectrometer (GC-MS)
LI-COR LI 6400 Photosynthesis System

LI-COR LI 6400 Photosynthesis System

The LICOR 6400 (LI-6400) utilizes gas exchange principles to measure the photosynthesis rates of plants.

Institution: 
University of Zululand
Other

AJA International Sputter Coater Sputter Coater

The equipment can be used to deposit thin films on various substrates.

Institution: 
University of Zululand
OtherSputter Coater
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Sputtering System Sigma VP FE-SEM with Oxford EDS Electron Microscopes

Sputtering System Sigma VP FE-SEM with Oxford EDS Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)