Equipment Filter

Jeol JEM 2100 Transmission Electron Microscope (TEM) Electron Microscopes

Jeol JEM 2100 Transmission Electron Microscope (TEM) Electron Microscopes

The TEM is configured to be an analytical facility to investigate and characterize the internal structure of very thin sections of material, up to

Institution: 
University of Johannesburg
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)
Jeol JSM 7900F FE-SEM

Jeol JSM 7900F FE-SEM

The field emission scanning electron microscope (FE-SEM) is an ultra-high-resolution materials characterization equipment that can be used for effe

Institution: 
University of Johannesburg
Microscope