Equipment Filter

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Synapt G2 Quadrupole TOF Mass Spectrometer Mass Spectrometer (MS)

Synapt G2 Quadrupole TOF Mass Spectrometer Mass Spectrometer (MS)

Mass Spectrometry is a critical tool in structure elucidation of unknown compounds.

Institution: 
Stellenbosch University
Mass Spectrometer (MS)
Spectrometers