Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)
Voxeljet VX 1000 3D Inkjet Sand Printer

Voxeljet VX 1000 3D Inkjet Sand Printer

The Voxeljet VX 1000 is an Additive Manufacturing (AM) process that manufactures moulds, cores or patterns, directly from CAD, using a layered manu

Institution: 
Vaal University of Technology
Other