Equipment Filter

Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

JEOL ARM200F double aberration corrected

Institution: 
Nelson Mandela Metropolitan University
Microscope
Jeol CP II Cross Section Polisher

Jeol CP II Cross Section Polisher

The Cross Section Polisher uses an Argon Ion Beam to prepare cross sections of materials for characterization by Scanning Electron Microscopy

Institution: 
Nelson Mandela Metropolitan University
Other
Gatan Inc. Quantum Imaging Filter and Tomography System - GIF Quantum

Gatan Inc. Quantum Imaging Filter and Tomography System - GIF Quantum

The Gatan Image Filter (GIF) is mounted below the TEM camera ch

Institution: 
Nelson Mandela Metropolitan University
Other

Silicon Drift Energy dispersive X-ray spectrometer Oxford XMax 100TLE Energy Dispersive X-ray Spectrometer

The XMax SDD EDS detector is attached to the atomic resolution HRTEM (Jeol ARM 200F).

Institution: 
Nelson Mandela Metropolitan University
SpectrometersEnergy Dispersive X-ray Spectrometer