Equipment Filter

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
Bruker D8 Advance/Discover XRD diffractometer  X-ray Diffractometer (XRD)

Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)

An XRD facility optimised for the following measurements

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
Leica DM 2500 M Optical Microscope

Leica DM 2500 M Optical Microscope

The Leica DM 2500 M is designed for material analysis and quality control.

Institution: 
University of Pretoria
Microscope
Perkin Elmer TGA 4000 ThermoGravimetric Analyser

Perkin Elmer TGA 4000 ThermoGravimetric Analyser

The Perkin Elmer TGA 4000 is designed with a compact ceramic furnace, which provides the temperature control for accurate results.

Institution: 
University of Pretoria
Other
Varian High-Vacuum Electron Beam Evaporator - 3117 E-Beam Evaporator High Vacuum Electron Beam Evaporator

Varian High-Vacuum Electron Beam Evaporator - 3117 E-Beam Evaporator High Vacuum Electron Beam Evaporator

High-Vacuum Electron Beam Evaporator systems are used for fabrication of single and multi-layer thin film specimens.

Institution: 
iThemba LABS
OtherHigh Vacuum Electron Beam Evaporator
Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes

Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes

20 nA FEGSEM with: airlock, STEM, Oxford EDS/EBSD, Quorum Cryo system, charge compensator, plasma cleaner.

Institution: 
University of KwaZulu-Natal
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)

Multifunctional Optical platform Ocean Optics based system

The equipment consists of the following sub-units:

- Ellipsometry unit,

- Normal incidence optical rectometry unit,

Institution: 
iThemba LABS
Other