Equipment Filter

Technical University of Denmark DI Flux - Absolute G

Absolute observations were carried out on a regular basis at each observatory by means of a DI-

Institution: 
South African National Space Agency (SANSA)
Other
GEM Systems Vector Magnetometer dIdD -Susp

GEM Systems Vector Magnetometer dIdD -Susp

The Suspended dIdD comprises a revolutionary small diameter (250 mm),spherical 

Institution: 
South African National Space Agency (SANSA)
Magnetometer

Technical University of Denmark Vector Magnetometer FGE FGM-FGE

The Vector Magnetometer FGE is a type of FGE

Institution: 
South African National Space Agency (SANSA)
Magnetometer
Cameca  SX50 Electron Microprobe

Cameca SX50 Electron Microprobe

The Cameca SX-50 Electron Microprobe is equipped with four multi-crystal wavelength-dispersive spectrometers (WDS) and one energy-dispersive spectr

Institution: 
Mintek
Other
Shimadzu Energy Dispersive X-Ray Spectrometer – EDX-700HS Energy Dispersive X-ray Spectrometer

Shimadzu Energy Dispersive X-Ray Spectrometer – EDX-700HS Energy Dispersive X-ray Spectrometer

Energy Dispersive X-Ray Spectroscopy (EDS or EDX) is a chemical microanalysis technique used in conjunction with scanning electron microscopy (SEM)

Institution: 
Mintek
SpectrometersEnergy Dispersive X-ray Spectrometer
FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)

The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analy

Institution: 
Mintek
Microscope
Olympus Industrial iSpeed 3 - High Speed Digital Video Camera

Olympus Industrial iSpeed 3 - High Speed Digital Video Camera

The Olympus i-SPEED 3 high speed video camera has been designed to an advanced specification providing high resolution, extreme low light sensitivi

Institution: 
Mintek
Other
Jeol 840A Scanning Electron Microscope (SEM)

Jeol 840A Scanning Electron Microscope (SEM)

The JEOL 840A is a medium resol

Institution: 
Mintek
Microscope