Equipment Filter

Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope

JEOL ARM200F double aberration corrected

Institution: 
Nelson Mandela Metropolitan University
Microscope
Jeol CP II Cross Section Polisher

Jeol CP II Cross Section Polisher

The Cross Section Polisher uses an Argon Ion Beam to prepare cross sections of materials for characterization by Scanning Electron Microscopy

Institution: 
Nelson Mandela Metropolitan University
Other