Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)

FEI Helix Detector (HD) Gaseous Analytical Detector (GAD) and Electron Backscatter Diffraction Detector (EBDD)

The equipment consists of additional detectors for the Nova NanoSEM: Helix Detector.

Institution: 
Mintek
Detectors

NETZSCH GmbH Rhodium Furnace with Calorimetry Module for Simultaneous Thermal Analyser (STA) - Rhodium furnace Model 6.225.6-89

The Simultaneous Thermal Analysis system has a high temperature furnace capability of up to 1650o

Institution: 
Mintek
Thermal analysis system