Equipment Filter

Bruker D8 Advance/Discover XRD diffractometer  X-ray Diffractometer (XRD)

Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)

An XRD facility optimised for the following measurements

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes

The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)
FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

FEI Technai G2 F20 S-Twin MAT HRTEM Electron Microscopes

The instrument is a 200 kV FEG-TEM, with all the possible analytical facilities for full materials related analyses, equipped with scanning coils,

Institution: 
University of the Western Cape
MicroscopeElectron MicroscopesTransmission Electron Microscope (TEM)High Resolution TEM (HR-TEM)
Bruker D8 Discover with GADDS - Modular X-Ray Diffraction System X-ray Diffractometer (XRD)

Bruker D8 Discover with GADDS - Modular X-Ray Diffraction System X-ray Diffractometer (XRD)

The D8 DISCOVER with GADDS combines cutting edge x-ray technology of the highest quality

Institution: 
South African Nuclear Energy Corporation (NECSA)
DiffractometersX-ray Diffractometer (XRD)Modular XRD
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Gatan Solarus Heating specimen holder for TEM

Gatan Solarus Heating specimen holder for TEM

  1. Plasma cleaners eliminate contamination of specimens for high-resolution TEM.
Institution: 
University of Cape Town
Other