Equipment Filter

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)
Bruker D8 Advance/Discover XRD diffractometer  X-ray Diffractometer (XRD)

Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)

An XRD facility optimised for the following measurements

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
Electron nano-beam lithography JEBL-7001F Electron Microscopes

Electron nano-beam lithography JEBL-7001F Electron Microscopes

JEBL-7001F Electron Nano-beam Lithography with Four Nano Probe Electron Device Testing Station and Cantilever Probe Scanner at low Temperatures is

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)