Equipment Filter

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)

Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
Bruker D8 Advance/Discover XRD diffractometer  X-ray Diffractometer (XRD)

Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)

An XRD facility optimised for the following measurements

Institution: 
University of the Witwatersrand
DiffractometersX-ray Diffractometer (XRD)
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Tuneable-laser based time-resolved fluorescence spectrophotometer FLS980

Tuneable-laser based time-resolved fluorescence spectrophotometer FLS980

Fluorescence measurements involve exciting a sample (powder or liquid) with light of one wavelength and then measuring difference light (luminescen

Institution: 
University of the Free State
Spectrometers