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Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm.

Institution: 
University of Fort Hare
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)