Equipment Filter
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Institution:
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Institution:
Nelson Mandela Metropolitan University
Microscope
Bruker High Perfomance Digital FT-NMR 400 Avance III HD NanoBay Spectrometer & 500 Avance III HD NMR Spectrometer
The spectrometers use nuclear magnetic resonance to provide information on the molecular and structural dynamics of biological, organic and inorgan
Institution:
University of the Western Cape
Nuclear Magnetic Resonance Spectrometer (NMR)