Equipment Filter
Leica DM 2500 M Optical Microscope
The Leica DM 2500 M is designed for material analysis and quality control.
Institution:
University of Pretoria
Microscope
Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes
20 nA FEGSEM with: airlock, STEM, Oxford EDS/EBSD, Quorum Cryo system, charge compensator, plasma cleaner.
Institution:
University of KwaZulu-Natal
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
FEI Nova Nano SEM200 High Resolution Scanning Electron Microscope (HR-SEM) Upgrades (Raith Lithography, EBSD and EDAX Systems)
The FEI Novaô Nano SEM provides for high-quality nanoscale research tools for a variety of applications that involve sample characterization, analy
Institution:
Mintek
Microscope
Jeol JSM 7600F Field Emission Gun Ultra-High Resolution Scanning Electron Microscope Electron Microscopes
The JSM-7600F is a state of-the-art thermal field emission gun scanning electron microscope.
Institution:
Tshwane University of Technology
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)