Equipment Filter
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
JEOL ARM200F double aberration corrected
Institution:
Nelson Mandela Metropolitan University
Microscope
Jeol CP II Cross Section Polisher
The Cross Section Polisher uses an Argon Ion Beam to prepare cross sections of materials for characterization by Scanning Electron Microscopy
Institution:
Nelson Mandela Metropolitan University
Other