Equipment Filter
Bruker Dimension Icon Scanning Probe Microscope (SPM) Scanning Probe Microscopes
The Dimension Icon SPM has modules that can map low-and mid-strength electrical currents, resistance and capacitance, with nano-scale resolution, o
Institution:
University of Pretoria
Microscope›Scanning Probe Microscopes
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
JEOL ARM200F double aberration corrected
Institution:
Nelson Mandela Metropolitan University
Microscope
Philips CM20 Transmission Electron Microscope (TEM)
The Philips CM20 is an analytical TEM, with a tungsten electron gun, which can be operated between 20 and 200kV.
Institution:
Nelson Mandela Metropolitan University
Microscope
Philips EM 420 Transmission Electron Microscope (TEM)
The Philips EM420 is a standard TEM with a lattice resolution of 0.3nm, and operates at a maximun accelerating voltage of 120 kV.
Institution:
Nelson Mandela Metropolitan University
Microscope