Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Institution:
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
Voxeljet VX 1000 3D Inkjet Sand Printer
The Voxeljet VX 1000 is an Additive Manufacturing (AM) process that manufactures moulds, cores or patterns, directly from CAD, using a layered manu
Institution:
Vaal University of Technology
Other