Equipment Filter

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes

The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu

Institution: 
University of the Witwatersrand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)Focussed Ion-Beam SEM (FIB-SEM)
Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes

Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes

The Super Scanning Electron Microscope SSX-550 EDX is a scanning electron microscope with an integral energy dispersive X-ray fluorescence spectrom

Institution: 
University of the Free State
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes

Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes

20 nA FEGSEM with: airlock, STEM, Oxford EDS/EBSD, Quorum Cryo system, charge compensator, plasma cleaner.

Institution: 
University of KwaZulu-Natal
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
Jeol 1210 Electron Microscope  Electron Microscopes

Jeol 1210 Electron Microscope Electron Microscopes

The JEOL 1210 is a conventional transmission electron microscope which is optimized for high contrast imaging at low to moderate magnifications (&l

Institution: 
Rhodes University
MicroscopeElectron Microscopes
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes

The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.

Institution: 
University of Zululand
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)