Equipment Filter
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Institution:
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
Bruker Dimension FastScan Scanning Probe Microscope (SPM) Optical Microscope
The Dimension FastScan is a high speed multiple mode scanning probe microscope for morphological, phase, electrochemical and electrical characteris
Institution:
Nelson Mandela Metropolitan University
Microscope
Liquid-Water Isotope Analyzer
The Liquid-Water Isotope Analyser is a portable (27 kg), dimensions: 10"Hx38"Wx14D", bench top sized device that uses laser absorption spectroscopy
Institution:
University of Pretoria
Other