Equipment Filter
Jeol JEM 2100 Transmission Electron Microscope (TEM) Electron Microscopes
The TEM is configured to be an analytical facility to investigate and characterize the internal structure of very thin sections of material, up to
Institution:
University of Johannesburg
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)
Jeol JSM 7900F FE-SEM
The field emission scanning electron microscope (FE-SEM) is an ultra-high-resolution materials characterization equipment that can be used for effe
Institution:
University of Johannesburg
Microscope