Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Institution:
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
Shimadzu SSX-550 EDX Scanning Electron Microscope (SEM) Electron Microscopes
The Super Scanning Electron Microscope SSX-550 EDX is a scanning electron microscope with an integral energy dispersive X-ray fluorescence spectrom
Institution:
University of the Free State
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes
20 nA FEGSEM with: airlock, STEM, Oxford EDS/EBSD, Quorum Cryo system, charge compensator, plasma cleaner.
Institution:
University of KwaZulu-Natal
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)
Jeol 1210 Electron Microscope Electron Microscopes
The JEOL 1210 is a conventional transmission electron microscope which is optimized for high contrast imaging at low to moderate magnifications (&l
Institution:
Rhodes University
Microscope›Electron Microscopes
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Institution:
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)