Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Institution:
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
FEI Tecnai G2 Spirit (Twin) Transmission Electron Microscope (TEM) Electron Microscopes
The FEI Spirit is a high brightness (LaB6 sourced) high magnification, high resolution, 120kV TEM that is equipped with an ultrathin windowed energ
Institution:
University of the Witwatersrand
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)