Jeol 6400 Scanning Electron Microscope (SEM) Electron Microscopes

Model:

6400 Scanning Electron Microscope (SEM)

Manufacturer:

Supplier:

Jeol 6400 Scanning Electron Microscope (SEM) Electron Microscopes

The JEOL 6400 SEM can be used to examine surface details of solid materials. Internal surfaces can be exposed by sectioning or fracturing. It is equipped with an energy dispersive spectrometer which permits qualitative and quantitative compositional analysis. Image analysis software permits detection, measurement and analysis of features of interest

Category:

Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)

Location

University of Free State

Park West

Bloemfontein

9301

Contact Person/s

Name: Prof PWJ van Wyk
Phone: +27 51-401-2264
Email: vanwykpw@ufs.ac.za

Funding Information

Year of Acquisition:

1996

Locations

Agricultural Research Council	North West University	University of Johannesburg
Cape Penninsula University of Technology	Oceanographic Research Institute	University of KwaZulu-Natal
Central University of Technology	Rhodes University	University of Limpopo
Centre for Proteomics and Genomics Research	Sefako Makgato Health Sciences University	University of Pretoria
Council for Scientific and Industrial Research (CSIR)	South African Astronomical Observatory	University of South Africa
Durban University of Technology	South African Environmental Observation Network (SAEON)	University of the Free State
Hartebeesthoek Radio Astronomy Observatory (HartRAO)	South African Institute for Aquatic Biodiversity (SAIAB)	University of the Western Cape
iThemba LABS	South African National Space Agency (SANSA)	University of the Witwatersrand
Mintek	South African Nuclear Energy Corporation (NECSA)	University of Venda
National Institute for Communicable Diseases	Stellenbosch University	University of Zululand
National Museum	Tshwane University of Technology	Vaal University of Technology
National Zoological Gardens	University of Cape Town	Walter Sisulu University
Nelson Mandela Metropolitan University	University of Fort Hare

You are here

Jeol 6400 Scanning Electron Microscope (SEM) Electron Microscopes

Contact Person/s

Locations