Janis and Agilent CCR10-2MW67-450K-VMF and PNA 8361C

This is a combination of two state-of-the-art pieces of equipment to develop a cryogenic nano-(semiconductor) device testing unit for microwave conductivity measurement at low temperatures. This instrument is able to develop fast nano-devices, and measure both the low temperatures and high frequencies of nanostructures (yielding nearly ballistic conduction) which are essential for research purposes.  

The features of this instrument include:

1. Measurements at frequency 10MHz to 67GHz, temperatures from 300K – 10K (cryo-free) and also magnetic fields up to 0.1T.
2. Pre-calibrated (auto-calibrated) microwave probes with four-axis can measure a large number of nano-structured devices contacted through micrometer scale electrodes fabricated over a large wafer via special sharp tips connected to RF micromanipulators without changing the experimental conditions.
3. Small devices can be visualized directly through a microscope and imaged on the screen for accurate measurements.
4. By changing probes galvanometric measurements including electronic & thermal, hall transport and particularly three-terminal (gated) device test can be performed via quick sample change.
5. Windows based VNA, designed for nano-micro & commercial devices, performs 'time domain study' using Labview.