Janis and Agilent CCR10-2MW67-450K-VMF and PNA 8361C
This is a combination of two state-of-the-art pieces of equipment to develop a cryogenic nano-(semiconductor) device testing unit for microwave conductivity measurement at low temperatures. This instrument is able to develop fast nano-devices, and measure both the low temperatures and high frequencies of nanostructures (yielding nearly ballistic conduction) which are essential for research purposes.
The features of this instrument include:
Contact Person/s
Grantholder
Title: Dr
First Name: S
Last Name: Bhattacharyya
Phone: +27 11-717-6811
Email: Somnath.Bhattacharyya@wits.ac.za
First Name: S
Last Name: Bhattacharyya
Phone: +27 11-717-6811
Email: Somnath.Bhattacharyya@wits.ac.za