Jeol 6400 Scanning Electron Microscope (SEM) Electron Microscopes

Model: 
6400 Scanning Electron Microscope (SEM)
Make: 
Supplier: 

The JEOL 6400 SEM can be used to examine surface details of solid materials. Internal surfaces can be exposed by sectioning or fracturing. It is equipped with an energy dispersive spectrometer which permits qualitative and quantitative compositional analysis. Image analysis software permits detection, measurement and analysis of features of interest

Category: 
Microscope - Electron Microscopes - Scanning Electron Microscope (SEM)
Location
University of Free State
Park West
Bloemfontein
9301

Contact Person/s

Name: Prof PWJ van Wyk
Phone: +27 51-401-2264
Email: vanwykpw@ufs.ac.za
Funding Information
Year of Acquisition: 
1996