Philips PW1710 X-Ray Diffraction Spectrometer X-ray Diffractometer (XRD)

Model: 
PW1710 X-Ray Diffraction Spectrometer
Make: 
Supplier: 

The Philips PW1710 operates using Theta-2Theta geometry and is equipped with secondary monochromator, variable opening diffraction aperture and 35 sample charger. It is used for phase identification, quantitative volume fraction analysis of crystalline phases in alloys or minerals, peak profile/shift analysis and residual strain analysis.

Category: 
Diffractometers - X-ray Diffractometer (XRD)
Disciplines: 
Mineralogy
Location
University of Kwazulu-Natal
University Road
Wesville
4000

Contact Person/s

Name: Arthur Peterson
Phone: +27 31-260-7652
Funding Information
Year of Acquisition: 
1985