Philips

Philips EM 420 Transmission Electron Microscope (TEM)

The Philips EM420 is a standard TEM with a lattice resolution of 0.3nm, and operates at a maximun accelerating voltage of 120 kV. It is equipped with a STEM system, back-scattered and secondary electron detectors, and a Noran Quest EDS unit. This microscope is ideal for routine TEM investigations, EDS elemental mapping, and for training new TEM users.

Contact Person/s

Name: Prof JH Neethling
Phone: +27 41-504-2143
Email: jan.neethling@nmmu.ac.za
Philips EM 420 Transmission Electron Microscope (TEM)

Philips DSA, C-Arm (X-Ray and Angiography Machine)

Compact, mobile, multi-directional C-Arm fluoroscopy system with pulsed techonology incorporating a mobile view station for most challenging interventional procedures. It contains supported X-ray modes, which include: 1. Low dose fluoroscopy 2. High definition fluoroscopy 3. Pulsed fluoroscopy (12.5pps) 4. Half dose fluoroscopy (12.5pps) 5. Quater dose fluoroscopy (12.5pps) 6. Digital exposure, Pulsed exposure (8pps) 7.

Grantholder

Title: Prof
First Name: P
Last Name: Zilla
Phone: +27 21-406-6476
Email: Peter.zilla@uct.ac.za

Contact Person/s

Name: Prof P Zilla
Phone: +27 21-406-6476
Email: Peter.zilla@uct.ac.za

Philips PW1710 X-Ray Diffraction Spectrometer X-ray Diffractometer (XRD)

The Philips PW1710 operates using Theta-2Theta geometry and is equipped with secondary monochromator, variable opening diffraction aperture and 35 sample charger. It is used for phase identification, quantitative volume fraction analysis of crystalline phases in alloys or minerals, peak profile/shift analysis and residual strain analysis.

Contact Person/s

Name: Arthur Peterson
Phone: +27 31-260-7652
Philips PW1710 X-Ray Diffraction Spectrometer X-ray Diffractometer (XRD)

Philips PW1404 X-ray Fluoresence (XRF) Spectrometer

The Philips PW1404 sequential spectrometer system is the latest in the complete line of systems that has continually set the standards in XRF spectroscopy. It is an evolution of the PW1400, it has improved optics, electronics and the software that makes easy to operate and the most precise element analysis from uranium to carbon. As a result of lower backgrounds, sensitivity is improved particularly for light element analysis.

Contact Person/s

Name: Arthur Peterson
Phone: +27 31-260-7652
Philips PW1404 X-ray Fluoresence (XRF) Spectrometer

Philips X-ray Fluoresence (XRF) Spectrometer

Philips X'Unique XRF wavelength spectrometer with 90 sample-changer and a selection of X-ray tubes: Mo/Sc, Cr, Au and Rh. A Claisse Fluxer is available to aid in the preparation of fusion disks. A ten-ton cold press is used for preparation of powder briguettes. Sample crushing is done using a hydraulic splitter and Sturtevant Laboratory Jaw Crusher (Carbon Steel Ribbed Jaws). Crush material is powdered using a Seibtechnik Swingmill with C-Steel vessels.

Contact Person/s

Name: Arthur Peterson
Phone: +27 31-260-7652
Philips X-ray Fluoresence (XRF) Spectrometer

Philips CM10 Transmission Electron Microscope (TEM) Electron Microscopes

The Philips CM10 is a transmission electron microscope providing high contrast, routine observations of sections, negatively stained or shadowed specimens, etc. The microscope is simple to operate and generates high quality, high resolution images at conventional voltages (60 to 100 kV). 

Contact Person/s

Name: Mrs E van Wilpe
Phone: +27 12-529-8497
Email: erna.vanwilpe@up.ac.za
Philips CM10 Transmission Electron Microscope (TEM) Electron Microscopes