Equipment Filter

Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm.

Institution: 
University of Fort Hare
MicroscopeElectron MicroscopesScanning Electron Microscope (SEM)
HTTP/1.1 200 OK Date: Sun, 03 Aug 2025 22:42:32 GMT Server: Apache/2.4.7 (Ubuntu) X-Powered-By: PHP/5.5.9-1ubuntu4.24 Expires: Sun, 19 Nov 1978 05:00:00 GMT Cache-Control: no-cache, must-revalidate X-Content-Type-Options: nosniff Content-Language: en X-Frame-Options: SAMEORIGIN Permissions-Policy: interest-cohort=() X-Generator: Drupal 7 (http://drupal.org) Link: ; rel="canonical",; rel="shortlink" Content-Type: text/html; charset=utf-8