Equipment Filter
Jeol Superprobe Electron Microprobe
The Jeol SuperProbe is a high resolution, highly stable WD/ED Combined Electron Probe Microanalyzer (EPMA) with a new PC-based operating environmen
Philips PW1830 X-Ray Diffraction Spectrometer X-ray Diffractometer (XRD)
The Philips PW 1830 is equipped with a fine-focus tube, ICDD search/match program. It is used for qualitative and quantitative phase analysis.
Philips PW1710 X-Ray Diffraction Spectrometer X-ray Diffractometer (XRD)
The Philips PW1710 operates using Theta-2Theta geometry and is equipped with secondary monochromator, variable opening diffraction aperture and 35
FEI Quanta 600F FEG Mineral Liberation Analyser (MLA)
The FEI Quanta 600F FEG Mineral Liberation Analyser, is used in the examination, and quantification of the mineralogical nature of ores, concentrat
Varian 640 IR Fourier Transform Infrared Spectroscopy (FTIR) Fourier Transform Infrared Spectrometer (FTIR)
The Varian 640-IR Spectrometer design is based on a 38 mm dynamically aligned, 60° mechanical bearing Michelson interferometer and comes standard w
Olympus Industrial Olympus-SZX16 Stereo Microscope
The SZX16 is designed for advanced research and has a maximum numerical aperture of 0