Equipment Filter

Janis and Agilent CCR10-2MW67-450K-VMF and PNA 8361C

This is a combination of two state-of-the-art pieces of equipment to develop a cryogenic nano-(semiconductor) device testing unit for microwave con

Institution: 
University of the Witwatersrand
Other
Cryogenic   5 Tesla Cryogen Free Mini-VSM with Integrated VTI and high temperature facility to 700 K

Cryogenic 5 Tesla Cryogen Free Mini-VSM with Integrated VTI and high temperature facility to 700 K

The Mini Cryogen Free Measurement system (CFM) is a Physical Property Measurement System (PPMS) with several measurement options on the same system

Institution: 
University of KwaZulu-Natal
Other

Cryogenic Limited (United Kingdom) Physical Properties Measurement System (PPMS) Low Temperature Measurement System: T-1.4 K B-9T Physical Properties Measurement System (PPMS)

The PPMS system allows for the measurement of electrical (electrical conductivity, Hal

Institution: 
iThemba LABS
OtherPhysical Properties Measurement System (PPMS)