Equipment Filter
Jeol JEM-ARM200F Double Corrected HRTEM Atomic Resolution Transmission Electrom Microscope Electron microscope
JEOL ARM200F double aberration corrected
Institution:
Nelson Mandela Metropolitan University
Microscope
Field Emission Scanning Electron Microscope (FE-SEM) with cathodoluminescene spectrometer JSM-7800F Electron microscope
This is field emission gun scanning electron microscope fitted with Gatan monoCL for imaging and spectroscopy, and EDS for chemical composition ana
Institution:
University of the Free State
Microscope
Carl Zeiss Supra 55 Variable Pressure Field Emission Scanning Electron Microscope (VP FE-SEM) Electron microscope
The Zeiss Supra 55VP FE-SEM is a high resolution state-of-the-art variable pressure field emission scanning electron microscope operating at extrem
Institution:
Sefako Makgato Health Sciences University
Microscope
Zeiss Atomic Force Microscopy with electrochemical capabilities Electron microscope
An atomic force microscope is optimised for measuring surface features that are extremely small in the nanometer scale.
Institution:
Rhodes University
Microscope