Equipment Filter
Bruker D8 Advance/Discover XRD diffractometer X-ray Diffractometer (XRD)
An XRD facility optimised for the following measurements
Institution:
University of the Witwatersrand
Diffractometers›X-ray Diffractometer (XRD)
Carl Zeiss Sigma VP FE-SEM with Oxford EDS Sputtering System Electron Microscopes
The Carl-Zeiss Sigma FE-SEM is an Electron Microscope used for imaging.
Institution:
University of Zululand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)